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1

[IEEE 2017 IEEE International Parallel and Distributed Processing Symposium Workshops (IPDPSW) - Orlando / Buena Vista, FL, USA (2017.5.29-2017.6.2)] 2017 IEEE International Parallel and Distributed Processing Symposium Workshops (IPDPSW) - Using Machine Learning for Data Center Cooling Infrastructure Efficiency Prediction

Shoukourian, Hayk, Wilde, Torsten, Labrenz, Detlef, Bode, Arndt

Year:

2017

Language:

english

File:

PDF, 2.67 MB

english, 2017

2

[IEEE 2017 IEEE East-West Design & Test Symposium (EWDTS) - Novi Sad (2017.9.29-2017.10.2)] 2017 IEEE East-West Design & Test Symposium (EWDTS) - Experimental study on Hamming and Hsiao codes in the context of embedded applications

Tshagharyan, G., Harutyunyan, G., Shoukourian, S., Zorian, Y.

Year:

2017

Language:

english

File:

PDF, 215 KB

english, 2017

3

[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - Memory FIT Rate Mitigation Technique for Automotive SoCs

Boschi, Gabriele, Luongo, Donato, Lazzarotti, Duccio, Shaheen, Hanna, Grigoryan, Hayk, Harutyunyan, Gurgen, Shoukourian, Samvel, Zorian, Yervant

Year:

2019

File:

PDF, 314 KB

2019

4

A unified design methodology for offline and online testing

Shoukourian, S.K.

Journal:

IEEE Design & Test of Computers

Year:

1998

Language:

english

File:

PDF, 237 KB

english, 1998

5

Embedded-memory test and repair: infrastructure ip for soc yield

Zorian, Y., Shoukourian, S.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 267 KB

english, 2003

6

SoC yield optimization via an embedded-memory test and repair infrastructure

Shoukourian, S., Vardanian, V., Zorian, Y.

Journal:

IEEE Design & Test of Computers

Year:

2004

Language:

english

File:

PDF, 138 KB

english, 2004

7

[IEEE 2015 14th RoEduNet International Conference - Networking in Education and Research (RoEduNet NER) - Craiova, Romania (2015.9.24-2015.9.26)] 2015 14th RoEduNet International Conference - Networking in Education and Research (RoEduNet NER) - Strengthening compute and data intensive capacities of Armenia

Astsatryan, Hrachya, Sahakyan, Vladimir, Shoukourian, Yuri, Dongarra, Jack, Cros, Pierre-Henri, Dayde, Michel, Oster, Per

Year:

2015

File:

PDF, 698 KB

2015

8

[IEEE 2015 IEEE East-West Design & Test Symposium (EWDTS) - Batumi, Georgia (2015.9.26-2015.9.29)] 2015 IEEE East-West Design & Test Symposium (EWDTS) - A power based memory BIST grouping methodology

Martirosyan, L., Harutyunyan, G., Shoukourian, S., Zorian, Y.

Year:

2015

Language:

english

File:

PDF, 304 KB

english, 2015

9

Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism

Harutyunyan, G., Shoukourian, S., Zorian, Y.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2018

Language:

english

File:

PDF, 1.15 MB

english, 2018

10

[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs

Grigoryan, H., Shoukourian, S., Harutyunyan, G., Zorian, Y., Argyrides, C.

Year:

2018

File:

PDF, 296 KB

2018

11

The equivalence problem of multidimensional multitape automata

Haik Grigorian, Samvel Shoukourian

Journal:

Journal of Computer and System Sciences

Year:

2008

Language:

english

File:

PDF, 282 KB

english, 2008

12

EMSO-logic and automata related to homogeneous flow event structures

K Shahbazyan, Yu Shoukourian

Journal:

Theoretical Computer Science

Year:

2004

Language:

english

File:

PDF, 359 KB

english, 2004

13

On process languages in finite graphs

K. V. Shakhbazyan, Y. H. Shoukourian

Journal:

Journal of Mathematical Sciences

Year:

2000

Language:

english

File:

PDF, 613 KB

english, 2000

14

Equivalence of two-dimensional multitape automata

A. A. Grigoryan, S. K. Shoukourian

Journal:

Cybernetics and Systems Analysis

Year:

2008

File:

PDF, 241 KB

2008

15

Equivalence of regular expressions over a partially commutative alphabet

A. S. Shoukourian

Journal:

Cybernetics and Systems Analysis

Year:

2009

Language:

english

File:

PDF, 313 KB

english, 2009

16

Inclusion problems in trace monoids

K. V. Shahbazyan, Yu. H. Shoukourian

Journal:

Cybernetics and Systems Analysis

Year:

2010

Language:

english

File:

PDF, 144 KB

english, 2010

17

On trace inclusion optimization problems

K. V. Shahbazyan, Yu. H. Shoukourian

Journal:

Cybernetics and Systems Analysis

Year:

2010

Language:

english

File:

PDF, 262 KB

english, 2010

18

Symmetry Measure for Memory Test and Its Application in BIST Optimization

Gurgen Harutyunyan, Aram Hakhumyan, Samvel Shoukourian, Valery A. Vardanian, Yervant Zorian

Journal:

Journal of Electronic Testing

Year:

2011

Language:

english

File:

PDF, 378 KB

english, 2011

19

EMSO-Definability of Some Languages with Event Structures

K. V. Shahbazyan, Yu. G. Shoukourian

Journal:

Journal of Mathematical Sciences

Year:

2005

Language:

english

File:

PDF, 384 KB

english, 2005

20

Asynchronous trace-matching automata

K. V. Shahbazyan, Yu. H. Shoukourian

Journal:

Cybernetics and Systems Analysis

Year:

2012

Language:

english

File:

PDF, 121 KB

english, 2012

21

A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs

Harutyunyan, G., Shoukourian, S., Vardanian, V., Zorian, Y.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2012

Language:

english

File:

PDF, 327 KB

english, 2012

22

Monitoring Power Data: A first step towards a unified energy efficiency evaluation toolset for HPC data centers

Shoukourian, Hayk, Wilde, Torsten, Auweter, Axel, Bode, Arndt

Journal:

Environmental Modelling & Software

Year:

2014

Language:

english

File:

PDF, 4.04 MB

english, 2014

23

[IEEE 2013 Computer Science and Information Technologies (CSIT) - Yerevan, Armenia (2013.09.23-2013.09.27)] Ninth International Conference on Computer Science and Information Technologies Revised Selected Papers - E-Infrastructures in Armenia: Virtual research environments

Shoukourian, Yuri H., Sahakyan, Vladimir G., Astsatryan, Hrachya V.

Year:

2013

Language:

english

File:

PDF, 1.42 MB

english, 2013

24

[IEEE 2013 11th East-West Design and Test Symposium (EWDTS) - Rostov-on-Don, Russia (2013.09.27-2013.09.30)] East-West Design & Test Symposium (EWDTS 2013) - Impact of process variations on read failures in SRAMs

Harutyunyan, G., Shoukourian, S., Vardanian, V., Zorian, Y.

Year:

2013

Language:

english

File:

PDF, 206 KB

english, 2013

25

[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - A methodology for design and evaluation of redundancy allocation algorithms

Shoukourian, S., Vardanian, V.A., Zorian, Y.

Year:

2004

Language:

english

File:

PDF, 1.32 MB

english, 2004

26

[IEEE Comput. Soc. Press 13th IEEE VLSI Test Symposium - Princeton, NJ, USA (30 April-3 May 1995)] Proceedings 13th IEEE VLSI Test Symposium - An approach for system tests design and its application

Shoukourian, S.K., Kostanian, A.G., Margarian, V.A., Ashour, A.A.

Year:

1995

Language:

english

File:

PDF, 605 KB

english, 1995

27

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - A Robust Solution for Embedded Memory Test and Repair

Darbinyan, K., Harutyunyan, G., Shoukourian, S., Vardanian, V., Zorian, Y.

Year:

2011

Language:

english

File:

PDF, 112 KB

english, 2011

28

[IEEE 2011 7th Central and Eastern European Software Engineering Conference in Russia (CEE-SECR 2011) - Moscow, Russia (2011.10.31-2011.11.3)] 2011 7th Central and Eastern European Software Engineering Conference (CEE-SECR) - How to measure “soft” things?

Shoukourian, Arsen, Danielyan, Emma

Year:

2011

Language:

english

File:

PDF, 171 KB

english, 2011

29

Forbidden traces and forbidden subtraces

K. V. Shahbazyan,Yu. H. Shoukourian

Journal:

Cybernetics and Systems Analysis

Year:

2013

Language:

english

File:

PDF, 121 KB

english, 2013

30

[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - An effective solution for building memory BIST infrastructure based on fault periodicity

Harutyunyan, G., Shoukourian, S., Vardanian, V., Zorian, Y.

Year:

2013

Language:

english

File:

PDF, 294 KB

english, 2013

31

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Generic BIST architecture for testing of content addressable memories

Grigoryan, H., Harutyunyan, G., Shoukourian, S., Vardanian, V., Zorian, Y.

Year:

2011

Language:

english

File:

PDF, 217 KB

english, 2011

32

[IEEE 2013 11th East-West Design and Test Symposium (EWDTS) - Rostov-on-Don, Russia (2013.09.27-2013.09.30)] East-West Design & Test Symposium (EWDTS 2013) - An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters

Melkumyan, T., Harutyunyan, G., Shoukourian, S., Vardanian, V., Zorian, Y.

Year:

2013

Language:

english

File:

PDF, 177 KB

english, 2013

33

[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - An approach for evaluation of redundancy analysis algorithms

Shoukourian, S., Vardanian, V., Zorian, Y.

Year:

2001

Language:

english

File:

PDF, 362 KB

english, 2001

34

[IEEE 2013 Computer Science and Information Technologies (CSIT) - Yerevan, Armenia (2013.09.23-2013.09.27)] Ninth International Conference on Computer Science and Information Technologies Revised Selected Papers - Test solutions for nanoscale Systems-on-Chip: Algorithms, methods and test infrastructure

Zorian, Yervant, Shoukourian, Samvel

Year:

2013

Language:

english

File:

PDF, 908 KB

english, 2013

35

[IEEE 2014 International Conference on High Performance Computing & Simulation (HPCS) - Bologna, Italy (2014.7.21-2014.7.25)] 2014 International Conference on High Performance Computing & Simulation (HPCS) - DWPE, a new data center energy-efficiency metric bridging the gap between infrastructure and workload

Wilde, Torsten, Auweter, Axel, Patterson, Michael K., Shoukourian, Hayk, Huber, Herbert, Bode, Arndt, Labrenz, Detlef, Cavazzoni, Carlo

Year:

2014

Language:

english

File:

PDF, 894 KB

english, 2014

36

[IEEE 2014 East-West Design & Test Symposium (EWDTS) - Kiev, Ukraine (2014.9.26-2014.9.29)] Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) - Extending fault periodicity table for testing faults in memories under 20nm

Harutyunyan, G., Shoukourian, S., Vardanian, V., Zorian, Y.

Year:

2014

Language:

english

File:

PDF, 232 KB

english, 2014

37

[IEEE 2013 11th East-West Design and Test Symposium (EWDTS) - Rostov-on-Don, Russia (2013.09.27-2013.09.30)] East-West Design & Test Symposium (EWDTS 2013) - Application of defect injection flow for fault validation in memories

Amirkhanyan, K., Davtyan, A., Harutyunyan, G., Melkumyan, T., Shoukourian, S., Vardanian, V., Zorian, Y.

Year:

2013

Language:

english

File:

PDF, 679 KB

english, 2013

38

[IEEE 2015 International Conference on High Performance Computing & Simulation (HPCS) - Amsterdam, Netherlands (2015.7.20-2015.7.24)] 2015 International Conference on High Performance Computing & Simulation (HPCS) - Power variation aware Configuration Adviser for scalable HPC schedulers

Shoukourian, Hayk, Wilde, Torsten, Auweter, Axel, Bode, Arndt

Year:

2015

Language:

english

File:

PDF, 1.62 MB

english, 2015

39

[IEEE 2015 IEEE 11th International Conference on e-Science (e-Science) - Munich, Germany (2015.8.31-2015.9.4)] 2015 IEEE 11th International Conference on e-Science - WRF-ARW Model for Prediction of High Temperatures in South and South East Regions of Armenia

Astsatryan, H., Shakhnazaryan, A., Sahakyan, V., Shoukourian, Yu., Kotroni, V., Petrosyan, Z., Abrahamyan, R., Melkonyan, H.

Year:

2015

Language:

english

File:

PDF, 866 KB

english, 2015

40

[IEEE 2015 IEEE East-West Design & Test Symposium (EWDTS) - Batumi, Georgia (2015.9.26-2015.9.29)] 2015 IEEE East-West Design & Test Symposium (EWDTS) - An efficient approach for memory repair by reducing the number of spares

Sargsyan, Vrezh, Vardanian, Valery, Shoukourian, Samvel, Zorian, Yervant, Yessayan, Avetik

Year:

2015

Language:

english

File:

PDF, 125 KB

english, 2015

41

[IEEE 2015 IEEE East-West Design & Test Symposium (EWDTS) - Batumi, Georgia (2015.9.26-2015.9.29)] 2015 IEEE East-West Design & Test Symposium (EWDTS) - Overview study on fault modeling and test methodology development for FinFET-based memories

Tshagharyan, G., Harutyunyan, G., Shoukourian, S., Zorian, Y.

Year:

2015

Language:

english

File:

PDF, 400 KB

english, 2015

42

[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - Securing test infrastructure of system-on-chips

Tshagharyan, G., Harutyunyan, G., Shoukourian, S., Zorian, Y.

Year:

2016

Language:

english

File:

PDF, 242 KB

english, 2016

43

Analysis of the efficiency characteristics of the first High-Temperature Direct Liquid Cooled Petascale supercomputer and its cooling infrastructure

Shoukourian, Hayk, Wilde, Torsten, Huber, Herbert, Bode, Arndt

Journal:

Journal of Parallel and Distributed Computing

Year:

2017

Language:

english

File:

PDF, 4.97 MB

english, 2017

44

[IEEE 2017 IEEE East-West Design & Test Symposium (EWDTS) - Novi Sad (2017.9.29-2017.10.2)] 2017 IEEE East-West Design & Test Symposium (EWDTS) - Automated flow for test pattern creation for IPs in SoC

Sargsyan, D., Harutyunyan, G., Shoukourian, S., Zorian, Y.

Year:

2017

Language:

english

File:

PDF, 268 KB

english, 2017

45

Memory Physical Aware Multi-Level Fault Diagnosis Flow

Harutyunyan, Gurgen, Martirosyan, Suren, Shoukourian, Samvel, Zorian, Yervant

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2018

Language:

english

File:

PDF, 1.78 MB

english, 2018

46

[IEEE 2017 IEEE East-West Design & Test Symposium (EWDTS) - Novi Sad (2017.9.29-2017.10.2)] 2017 IEEE East-West Design & Test Symposium (EWDTS) - An efficient testing methodology for embedded flash memories

Martirosyan, S., Harutyunyan, G., Shoukourian, S., Zorian, Y.

Year:

2017

Language:

english

File:

PDF, 183 KB

english, 2017

47

[IEEE 2017 Computer Science and Information Technologies (CSIT) - Yerevan, Armenia (2017.9.25-2017.9.29)] 2017 Computer Science and Information Technologies (CSIT) - A multi-user and multi-purpose CA simulator

Nahapetyan, Hayk E., Jessel, Jean-Pierre, Poghosyan, Suren S., Shoukourian, Yuri H.

Year:

2017

Language:

english

File:

PDF, 401 KB

english, 2017

48

[IEEE 2017 Computer Science and Information Technologies (CSIT) - Yerevan (2017.9.25-2017.9.29)] 2017 Computer Science and Information Technologies (CSIT) - A mechanism of row redundancy sharing for reparable memory systems

Amirkhanyan, Karen, Shoukourian, Samvel, Vardanian, Valery

Year:

2017

Language:

english

File:

PDF, 1.06 MB

english, 2017

49

[IEEE 2019 IEEE 37th VLSI Test Symposium (VTS) - Monterey, CA, USA (2019.4.23-2019.4.25)] 2019 IEEE 37th VLSI Test Symposium (VTS) - Innovative Practices on In-System Test and Reliability of Memories

Bandyopadhyay, S., Mekkoth, J., Hutner, M., Grigoryan, H., S. Shoukourian, A. Kumar, Tshagharyan, G., Zorian, Y., Boschi, G., Lazzarotti, D., Luongo, D., Shaheen, H., Harutyunyan, G.

Year:

2019

File:

PDF, 9.57 MB

2019

50

[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - Armenia: Communicating to World Community in Electronic Test and Design

Shoukourian, Samvel, Shoukourian, Yuri, Sahakyan, Vladimir

Year:

2019

Language:

english

File:

PDF, 8.00 MB

english, 2019